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Internal Vapor Analysis is a complete quantitative analysis of the ambient gases contained within the hermetic cavity of microelectronic devices. The ORS IVA test is performed in accordance with ORS SOP MEL-1053 (an enhanced method from Mil-Std-883, Method 1018, Procedure 1, "Internal Water Vapor Content"), for hermetic cavity from 0.01cc and up ...
Moisture-related failure of microelectronic components have been prevalent throughout the Microelectronics Industry for many years. In the mid-1950s, Crawford and Weigand showed that water vapor was the greatest contamination problem ...
Residual Gas Analysis of hermetic microelectronic devices has traditionally been treated as a means for measuring a device's internal moisture content only. Too many times, the moisture reading is treated on a pass/fail basis using MIL-STD criteria that all devices must contain less than 5000 parts per million by volume (ppmv) of moisture. In reality, the other gases routinely reported with the moisture contain a wealth of information...
The test sequence begins by loading a single sample on test instrument where the lid of the sample is sealed against a Viton™ O-ring. It is through the center of this O-ring that the puncture pin will be driven to pierce the package lid. This mounting procedure places most of the sample outside the realm of the mass spectrometer analyzer, ...
The Material Outgassing Characterization test developed at ORS is a qualitative and quantitative analysis of the gaseous substances desorbed from a material after thermal stress. The analysis measures the relative volumetric concentrations of volatile organics and other substances at the vapor state ...
The purpose of this test method is to quantitatively measure the relative concentration of the internal vapor content, including water vapor, in hermetically sealed, gas filled microelectronic devices using a mass spectrometric technique. This technique is destructive and is intended for the reporting of all volatile atomic and molecular species detected in the microelectronic device...
Instrustions for the use of ORS gas collection cylinders (dry box atmosphere sampling, gas line purity checking, etc.) ...
Form to be used when submitting samples for testing.
These formulas come from General Eastern documentation.
Tuesday 24 October 2017
Internal Vapor Analysis
Gas Collection Cylinders
Helium fine Leaks HSHLD™
Fluoro. Gross Leaks
Fluorescent Dye Penetrant
SOPs & Samples Tracking
ORS in the USA
IVA Submission Form